Torthaí cuardaigh - Yi-wei XU
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Characterization of wheat monogenic lines with known Sr genes and wheat cultivars for resistance to three new races of Puccinia graminis f. sp. tritici in China de réir Xian-xin WU, Chao-qun ZANG, Ya-zhao ZHANG, Yi-wei XU, Shu WANG, Tian-ya LI, Li GAO
Foilsithe / Cruthaithe 2023-06-01Wheat stem rust, caused by Puccinia graminis f. sp. tritici (Pgt), is a potentially devastating fungal disease of wheat worldwide. The present study was to evaluate the resistance of 42 wheat monogenic lines with known stem rust resistance (Sr) genes and 69 wheat cultivars to three new Pgt races (34...
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