Search Results - Wang, Juen-Kai

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    High-Resolution Near-Field Optical Microscopy: A Sub-10 Nanometer Probe for Surface Electromagnetic Field and Local Dielectric Trait

    High-Resolution Near-Field Optical Microscopy: A Sub-10 Nanometer Probe for Surface Electromagnetic Field and Local Dielectric Trait by Chu, Jen-You, Wang, Juen-Kai

    Published 2012
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