Search Results - Valter Castelvetro

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    Atomic Force Microscopy (AFM) nanomechanical characterization of micro- and nanoplastics to support environmental investigations in groundwater

    Atomic Force Microscopy (AFM) nanomechanical characterization of micro- and nanoplastics to support environmental investigations in groundwater by Massimiliano Galluzzi, Michele Lancia, Chunmiao Zheng, Viviana Re, Valter Castelvetro, Shifeng Guo, Stefano Viaroli

    Published 2025-06-01
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