Search Results - V. V. Arbenina

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  1. 1
    Influence of Cd<sub>х</sub>Hg<sub>1-х</sub>Te epitaxial layers defects on photo-electric parameters of matrix detector devices

    Influence of Cd<sub>х</sub>Hg<sub>1-х</sub>Te epitaxial layers defects on photo-electric parameters of matrix detector devices by V. V. Arbenina, A. S. Kashuba, Е. V. Permikina

    Published 2013-12-01
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  2. 2
    Estimation of diffusion behaviour of metals used for the creation of multilayered contacts to heterostructures based on GaAs

    Estimation of diffusion behaviour of metals used for the creation of multilayered contacts to heterostructures based on GaAs by V. V. Arbenina, A. S. Kashuba, E. V. Permikina

    Published 2014-10-01
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  3. 3
    Database on properties and technical characteristics of semiconductor materials

    Database on properties and technical characteristics of semiconductor materials by T. V. Stol'nikova, K. Yu. Kolybanov, V. V. Arbenina

    Published 2008-08-01
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  4. 4
    Computer modeling of processes of semiconductor technology through information-calculating system

    Computer modeling of processes of semiconductor technology through information-calculating system by V. V. Arbenina, R. Kh. Akchurin, L. B. Berliner

    Published 2015-06-01
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  5. 5
    The research of process of CdTe passivation coverings formation on epitaxial layers CdхHg1-хTe for creation of IRphotodetectors.

    The research of process of CdTe passivation coverings formation on epitaxial layers CdхHg1-хTe for creation of IRphotodetectors. by V. V. Arbenina, T. V. Danilova, A. S. Kashuba, E. V. Permikina

    Published 2007-10-01
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  6. 6
    The influence of the epitaxial layers surface morphology and polarity on quality of passivating coating and the parameters of arrays photosensitive devices on base Cd<sub>х</sub>Hg<sub>1-х</sub>Te

    The influence of the epitaxial layers surface morphology and polarity on quality of passivating coating and the parameters of arrays photosensitive devices on base Cd<sub>х</sub>Hg... by I. D. Burlakov, A. S. Kashuba, S. V. Golovin, E. V. Permikina, V. V. Arbenina

    Published 2009-08-01
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  7. 7
    High-resolution microscopy methods for surface morphology semiconductors investigation

    High-resolution microscopy methods for surface morphology semiconductors investigation by A. E. Mirofyanchenko, A. S. Kashuba, E. V. Pryanikova, N. I. Yakovleva, V. V. Arbenina

    Published 2015-12-01
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  8. 8
    The study of morphology of heteroepytaxial structures on the basis of photosensitive layers Cd<sub>X</sub>Hg<sub>1-X</sub>Te by electron probe analysis methods

    The study of morphology of heteroepytaxial structures on the basis of photosensitive layers Cd<sub>X</sub>Hg<sub>1-X</sub>Te by electron probe analysis methods by А. С. Kashuba, A. V. Zablotsky, E. V. Korostylev, A. A. Kuzin, E. V. Permikina, V. V. Arbenina

    Published 2010-10-01
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