Search Results - Teng-To Yu

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    Defect Detection and Error Source Tracing in Laser Marking of Silicon Wafers with Machine Learning

    Defect Detection and Error Source Tracing in Laser Marking of Silicon Wafers with Machine Learning by Hsiao-Chung Wang, Teng-To Yu, Wen-Fei Peng

    Published 2025-06-01
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    Merging Various Types of Remote Sensing Data and Social Participation GIS with AI to Map the Objects Affected by Light Occlusion

    Merging Various Types of Remote Sensing Data and Social Participation GIS with AI to Map the Objects Affected by Light Occlusion by Yen-Chun Lin, Teng-To Yu, Yu-En Yang, Jo-Chi Lin, Guang-Wen Lien, Shyh-Chin Lan

    Published 2025-06-01
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