Résultats de la recherche - Shaikh Ayaan
- Résultat(s) 1 - 1 résultats de 1
-
1
Knowledge based full aperture polishing par Schneckenburger Max, Shaikh Ayaan, Algac Ufuc, Mewis Jan
Publié 2025-01-01Understanding and controlling of the polishing process on conventional NC (Numerical Control) machines is an important step to optimize production, reduce machine time and increase production quality. Nevertheless, due to the high number of process parameters, polishing is not understood and is almo...
Accéder au texte intégral
Article