Search Results - R. I. Vorobey

X-ray Diffraction Method in the Study of a Metal Surface Stress State Under Static and Impact Deformation by A. P. Kren, M. N. Delendik, O. V. Matsulevich, O. K. Gusev, K. U. Pantsialeyeu, R. I. Vorobey

Get full text

Charge-Sensitive Technique for Deformation Processes’ Study by K. U. Pantsialeyeu, U. A. Mikitsevich, A. I. Svistun, R. I. Vorobey, O. K. Gusev, A. L. Zharin

Get full text

KELVIN PROBE SELF-CALIBRATION MODE FOR SEMICONDUCTOR WAFERS PROPERTIES MONITORING by R. I. Vorobey, O. K. Gusev, A. L. Zharin, A. N. Petlitsky, V. A. Pilipenko, A. S. Turtsevitch, A. K. Tyavlovsky

Get full text

ANALYSIS OF THE ELECTROPHYSICAL AND PHOTOELECTRIC PROPERTIES OF NANOCOMPOSITE POLYMERS BY THE MODIFIED KELVIN PROBE by K. U. Pantsialeyeu, A. U. Krautsevich, I. A. Rovba, V. I. Lysenko, R. I. Vorobey, O. K. Gusev, A. L. Zharin

Get full text

KELVIN PROBE’S STRAY CAPACITANCE AND NOISE SIMULATION by S. Danyluk, A. V. Dubanevich, O. K. Gusev, A. I. Svistun, A. K. Tyavlovsky, K. L. Tyavlovsky, R. I. Vorobey, A. L. Zharin

Get full text

THE MULTIFUNCTION MEASURING CONVERTER FOR MONITORING OF LIQUID TECHNOLOGICAL MEDIA by R. I. Vorobey, O. K. Gusev, A. L. Zharin, Yu. G. Kuzminsky, A. I. Svistun, A. K. Tyavlovsky, K. L. Tyavlovsky, S. V. Shilko

Get full text

STUDY OF SILICON-INSULATOR STRUCTURE DEFECTS BASED ON ANALYSIS OF A SPATIAL DISTRIBUTION OF A SEMICONDUCTOR WAFERS’ SURFACE POTENTIAL by R. I. Vorobey, O. K. Gusev, A. L. Zharin, A. N. Petlitsky, V. A. Pilipenko, A. S. Turtsevitch, A. K. Tyavlovsky, K. L. Tyavlovsky

Get full text

STUDY OF SILICON-INSULATOR STRUCTURE DEFECTS BASED ON ANALYSIS OF A SPATIAL DISTRIBUTION OF A SEMICONDUCTOR WAFERS’ SURFACE POTENTIAL by R. I. Vorobey, O. K. Gusev, A. L. Zharin, A. N. Petlitsky, V. A. Pilipenko, A. S. Turtsevitch, A. K. Tyavlovsky, K. L. Tyavlovsky

Get full text

Series of Photovoltaic Converters Based on Semiconductors with Intrinsic Photoconductivity by R. I. Vorobey, O. K. Gusev, A. L. Zharin, K. U. Pantsialeyeu, A. I. Svistun, A. K. Tyavlovsky, K. L. Tyavlovsky, L. I. Shadurskaya

Get full text

Surface Electric Potential Measurement with a Static Probe by R. I. Vorobey, O. K. Gusev, A. I. Zharin, V. A. Mikitsevich, K. U. Pantsialeyeu, A. V. Samarina, A. I. Svistun, A. K. Tyavlovsky, K. L. Tyavlovsky

Get full text

CHARACTERIZATION OF THE ELECTROPHYSICAL PROPERTIES OF SILICON-SILICON DIOXIDE INTERFACE USING PROBE ELECTROMETRY METHODS by V. А. Pilipenko, V. A. Saladukha, V. A. Filipenya, R. I. Vorobey, O. K. Gusev, A. L. Zharin, K. V. Pantsialeyeu, A. I. Svistun, A. K. Tyavlovsky, K. L. Tyavlovsky

Get full text