Search Results - N. S. Kovalchuk

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  1. 1
    Effect of Pulsed Photon Processing in Nitrogen Ambient on Optical and Electrophysical Characteristics of Silicon Dioxide Layers of Its Boundaries with Silicon

    Effect of Pulsed Photon Processing in Nitrogen Ambient on Optical and Electrophysical Characteristics of Silicon Dioxide Layers of Its Boundaries with Silicon by N. S. Kovalchuk, V. A. Pilipenko, Ja. A. Solovjov

    Published 2025-07-01
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  2. 2
    Energy-Dispersive X-Ray Microanalysis – as a Method for Study the Aluminium-Polysilicon Interface after Exposure with Long-Term and Rapid Thermal Annealing

    Energy-Dispersive X-Ray Microanalysis – as a Method for Study the Aluminium-Polysilicon Interface after Exposure with Long-Term and Rapid Thermal Annealing by U. A. Pilipenko, N. S. Kovalchuk, D. V. Shestovski, D. V. Zhyhulin

    Published 2024-07-01
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  3. 3
    Deposition of SiN<sub>x</sub> Films with Controlled Residual Stress from SiH<sub>4</sub>-NH<sub>3</sub>-He Gaseous Mixture in Inductively Coupled Plasma

    Deposition of SiN<sub>x</sub> Films with Controlled Residual Stress from SiH<sub>4</sub>-NH<sub>3</sub>-He Gaseous Mixture in Inductively Coupled Plasma by N. S. Koval’chuk, S. A. Demidovich, L. A. Vlasukova, I. N. Parkhomenko

    Published 2024-02-01
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  4. 4
    AGES AND SEX DEPENDENCE OF SPECIFIC IMMUNE RESPONSE IN THE PERSONS INOCULATED WITH TICKSBORNE ENCEPHALITIS VACCINE

    AGES AND SEX DEPENDENCE OF SPECIFIC IMMUNE RESPONSE IN THE PERSONS INOCULATED WITH TICKSBORNE ENCEPHALITIS VACCINE by G. N. Leonova, E. V. Pavlenko, N. V. Krylova, O. S. Maystrovskaya, N. V. Kovalchuk

    Published 2014-07-01
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  5. 5
    Formation of a gate dielectric of nanometer thickness by rapid thermal treatment

    Formation of a gate dielectric of nanometer thickness by rapid thermal treatment by N. S. Kovalchuk, A. A. Omelchenko, V. A. Pilipenko, V. A. Solodukha, D. V. Shestovski

    Published 2021-07-01
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  6. 6
    The Influence of Rapid Heat Treatment During the Formation of Aluminum-Polysilicon Contacts on the Electrical Parameters of CMOS Microcircuits

    The Influence of Rapid Heat Treatment During the Formation of Aluminum-Polysilicon Contacts on the Electrical Parameters of CMOS Microcircuits by V. A. Pilipenko, N. S. Kovalchuk, Ja. A. Solovjov, D. V. Shestovski, D. V. Zhyhulin

    Published 2024-10-01
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  7. 7
    Thermal Load Influence during the Formation of Al-Al Contacts on the Electrical Parameters of the Integrated Circuits with Aluminum-Polysilicon Contacts

    Thermal Load Influence during the Formation of Al-Al Contacts on the Electrical Parameters of the Integrated Circuits with Aluminum-Polysilicon Contacts by V. A. Pilipenko, V. A. Solodukha, N. S. Kovalchuk, J. A. Solovjov, D. V. Shestovski, D. V. Zhyhulin

    Published 2022-12-01
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  8. 8
    Research of Electrophysical Properties of Thin Gate Dielectrics Obtained by Rapid Thermal Processing Method

    Research of Electrophysical Properties of Thin Gate Dielectrics Obtained by Rapid Thermal Processing Method by N. S. Kovalchuk, A. A. Omelchenko, V. A. Pilipenko, V. A. Solodukha, S. V. Demidovich, V. V. Kolos, V. A. Filipenia, D. V. Shestovski

    Published 2022-06-01
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  9. 9
    Avalanche LEDs Based on Nanostructured Silicon for Microwave Frequency Range

    Avalanche LEDs Based on Nanostructured Silicon for Microwave Frequency Range by S. K. Lazarouk, A. A. Leshok, A. V. Dolbik, L. P. Tamashevich, A. Y. Klutsky, V. V. Dudich, V. A. Labunov, S. A. Efimenko, N. S. Kovalchuk, E. P. Kitsyuk, R. M. Ryazanov, A. S. Basaev, V. V. Svetukhin

    Published 2025-04-01
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