Search Results - N. I. Yakovleva

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    High-resolution microscopy methods for surface morphology semiconductors investigation

    High-resolution microscopy methods for surface morphology semiconductors investigation by A. E. Mirofyanchenko, A. S. Kashuba, E. V. Pryanikova, N. I. Yakovleva, V. V. Arbenina

    Published 2015-12-01
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    INVESTIGATION OF Ge SUBSTRATES FOR MCT GROWN BY MOLECULAR-BEAM EPITAXY

    INVESTIGATION OF Ge SUBSTRATES FOR MCT GROWN BY MOLECULAR-BEAM EPITAXY by A. L. Sizov, I. D. Burlakov, N. I. Yakovleva, E. D. Korotaev, A. E. Mirofyanchenko

    Published 2013-10-01
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