Search Results - Ling Lv

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    The Impact of Single-Event Radiation on Latch-Up Effect in High-Temperature CMOS Devices and Its Mechanism

    The Impact of Single-Event Radiation on Latch-Up Effect in High-Temperature CMOS Devices and Its Mechanism by Bin Wang, Jianguo Cui, Ling Lv, Longsheng Wu

    Published 2025-06-01
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    Damage Mechanism Analysis of High Field Stress on Cascode GaN HEMT Power Devices

    Damage Mechanism Analysis of High Field Stress on Cascode GaN HEMT Power Devices by Shuo Su, Yanrong Cao, Weiwei Zhang, Xinxiang Zhang, Chuan Chen, Linshan Wu, Zhixian Zhang, Miaofen Li, Ling Lv, Xuefeng Zheng, Wenchao Tian, Xiaohua Ma, Yue Hao

    Published 2025-06-01
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