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    Dynamic Device Characteristics and Linewidth Measurement of InGaN/GaN Laser Diodes

    Dynamic Device Characteristics and Linewidth Measurement of InGaN/GaN Laser Diodes by Steffan Gwyn, Scott Watson, Thomas Slight, Martin Knapp, Shaun Viola, Pavlo Ivanov, Weikang Zhang, Amit Yadav, Edik Rafailov, Mohsin Haji, Kevin E Doherty, Szymon Stanczyk, Szymon Grzanka, Piotr Perlin, Stephen P Najda, Mike Leszczyski, Anthony E Kelly

    Published 2021-01-01
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