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    Atmospheric neutron inducing single event effects on AI chips manufacturing with 8 nm FinFET

    Atmospheric neutron inducing single event effects on AI chips manufacturing with 8 nm FinFET by Yonghong Li, Jianan Tong, Weitao Yang, Zhiliang Hu, Lihua Mo, Tianjiao Liang, Chaohui He, Jinghui Lan

    Published 2025-11-01
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