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    Monte Carlo Simulation-Based Method for Evaluating Sample Thickness Variation to Improve Reliability of Dielectric Strength Assessment

    Monte Carlo Simulation-Based Method for Evaluating Sample Thickness Variation to Improve Reliability of Dielectric Strength Assessment by Keon-Hee Park, Seung-Won Lee, Hae-Jong Kim, Jang-Seob Lim

    Published 2025-01-01
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