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    Strain Effects in p-type Devices using Full-Band Monte Carlo Simulations

    Strain Effects in p-type Devices using Full-Band Monte Carlo Simulations by Aubry-Fortuna, Valérie, Huet, Karim, Nghiêm, T.T. Trang, Bournel, Arnaud, Saint-Martin, Jérôme, Dollfus, Philippe

    Published 2011
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    Electronic Book Chapter

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