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    Reliability Improvement of 28 nm Intel FPGA Ring Oscillator PUF for Chip Identification

    Reliability Improvement of 28 nm Intel FPGA Ring Oscillator PUF for Chip Identification by Zulfikar Zulfikar, Hubbul Walidainy, Aulia Rahman, Kahlil Muchtar

    Published 2025-05-01
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