Search Results - G. G. Chigir

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    Reliability Express Control of the Gate Dielectric of Semiconductor Devices

    Reliability Express Control of the Gate Dielectric of Semiconductor Devices by V. A. Solodukha, G. G. Chigir, V. A. Pilipenko, V. A. Filipenya, V. A. Gorushko

    Published 2018-12-01
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