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    Photoelastic Refractive Index Changes in GaAs Investigated by Finite Element Method (FEM) Simulations by Daniel T. Cassidy

    Published 2025-05-01

    Changes in the refractive indices of a GaAs laser chip owing to bonding strain are investigated by two-dimensional (2D) and three-dimensional (3D) finite element method (FEM) simulations. The strain induced by die attach (i.e., the bonding strain) was estimated by fitting simulations to the measured...

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