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    LE-YOLO: A Lightweight and Enhanced Algorithm for Detecting Surface Defects on Particleboard

    LE-YOLO: A Lightweight and Enhanced Algorithm for Detecting Surface Defects on Particleboard by Chao He, Yongkang Kang, Anning Ding, Wei Jia, Huaqiong Duo

    Published 2025-07-01

    Current algorithms for surface defect detection in particleboard often encounter limitations such as high computational complexity and excessive parameter scale. To address these challenges, this study proposes the LE-YOLO model, which incorporates a normalized Wasserstein distance into the loss fun...

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